White Light Interference Microscope MS1000

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首页 / Microscope / 产品详情-White Light Interference Microscope MS1000

White Light Interference Microscope MS1000

具备纳米及纵向分辨率，满足超光滑表面测量分析
PSI / VSI/ 明场等多种测量模式
载台可平移距离超200mm
载台可调角度、位置、分辨率高
简单、精确、快速、可重复性高
聚焦定位激光辅助干涉条纹定位功能
可支持不同倍率干涉物镜
支持不同订制需求

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