White Light Interference Microscope MS2000
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With high-precision resolution to meet the measurement and analysis of ultra-smooth surfaces
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PSI / VSI / Spectral Confocal Scanning / Super Depth of Field Measurement and other measurement modes
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Single measurement field of view: 500*350μm (can be automatically spliced)
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The stage can be adjusted in angle，position，and resolution
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Simple，precise，fast and highly reproducible
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Focused positioning Laser-assisted interferometric fringe positioning
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With a wide range of applications and flexible functionalities
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Automatic generation of test and analysis reports
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Meet different customization needs
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